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作 者:王志霞 刘月 高文冰 Wang Zhixia;Liu Yue;Gao Wenbing(Daqing Fourth Hospital,Stomatology 163712)
出 处:《现代科学仪器》2024年第6期169-173,共5页Modern Scientific Instruments
摘 要:目的:探寻后牙区种植单冠全数字化流程修复效果及并发症影响因素。方法:选取后牙区种植体单冠修复患者168例,随机分为试验组(全数字化流程修复)和对照组(常规修复)。对比两组种植成功率,2年存留率以及并发症情况。分析影响发生并发症的因素。结果:相较于对照组,试验组有更高的种植成功率、2年内存留率,以及更低的并发症总发生率(P<0.05)。牙周炎史、不良咬合习惯、种植体长度≥10mm为影响发生并发症独立危险因素,全数字化流程修复为保护因素。结论:后牙区种植单冠全数字化流程修复效果确切。临床可根据并发症影响因素给予针对性干预,降低发生率。Objective:To explore the effect of full digital process restoration of implant single crown in the posterior area and the influencing factors of complications.Methods:168 patients with implant crown restoration in the posterior area were randomly divided into experimental group(full digital process restoration)and control group(conventional restoration).The success rate,2-year survival rate and complications of the two groups were compared.The factors influencing the occurrence of complications were analyzed.Results:Compared with the control group,the experimental group had higher implantation success rate,2-year retention rate and lower total incidence of complications(P<0.05).Periodontitis history,bad occlusal habits and implant length≥10mm were independent risk factors for complications,and full digital process restoration was the protective factor.Conclusions:The full digital process of dental implant crown restoration in the posterior area is effective.Clinical intervention can be given according to the influencing factors of complications to reduce the incidence.
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