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作 者:Hong-Jun Gao Wu Zhou Ryo Ishikawa 高鸿钧;周武;Ryo Ishikawa(Institute of Physics and University of Chinese Academy of Sciences,Chinese Academy of Sciences,Beijing 100190,China;School of Physical Sciences,University of Chinese Academy of Sciences,Beijing 101408,China;Institute of Engineering Innovation,The University of Tokyo,Tokyo 113-8656,Japan)
机构地区:[1]Institute of Physics and University of Chinese Academy of Sciences,Chinese Academy of Sciences,Beijing 100190,China [2]School of Physical Sciences,University of Chinese Academy of Sciences,Beijing 101408,China [3]Institute of Engineering Innovation,The University of Tokyo,Tokyo 113-8656,Japan
出 处:《Chinese Physics B》2024年第12期1-2,共2页中国物理B(英文版)
摘 要:The interplay between advanced microscopy techniques and fundamental scientific discovery has always been a cornerstone of physics.Among the many tools that have reshaped our understanding of condensed matter and materials physics,scanning transmission electron microscopy(STEM)stands out as a transformative technique.By enabling direct atomic-scale imaging and advanced spectroscopic analysis,STEM has illuminated the complex atomic structures and dynamics that underpin material properties.In this spirit of innovation and discovery,we dedicate this special issue to celebrate the illustrious contributions of Prof.Stephen J.Pennycook,a pioneer whose work has defined the field of STEM and its applications.
关 键 词:properties STEM CORNERS
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