快速软恢复二极管局域寿命控制数值分析  

Numerical Analysis of Local Lifetime Control for Fast Soft Recovery Diode

作　　者：陈曦[1] 田敬民[1] 李守智[1] 

机构地区：[1]西安理工大学,西安710048

出　　处：《电力电子技术》2002年第6期70-72,共3页Power Electronics

摘　　要：采用混合器件模型研究了局域寿命控制技术对快速软恢复功率二极管静态和动态特性的影响 ,模拟结果表明 :低寿命区的最佳位置处于基区靠近阳极 ,其最佳宽度取决于载流子寿命减少的数量。The effects of localized lifetime control technique on the static and dynamic characteristics of a power PIN diode are investigated by use of mixed device circuit model. The simulations show that the optimal position for the low-lifetime region is at the beginnig of the base region on the anode side, while the optimal width of the low-life-time region depends on the amount of carrier lifetime reduction.

关 键 词：二极管 局域寿命控制 数值分析 载流子 

分 类 号：TN31[电子电信—物理电子学]