麦秆表面硅含量分布的研究  

STUDY ON SILICA DISTRIBUTION OF WHEAT STRAW SURFACE

作　　者：苏润洲[1] 刘志明[1] 李坚[1] 艾军[1] 

机构地区：[1]东北林业大学,哈尔滨150040

出　　处：《林业科学》2002年第6期99-102,共4页Scientia Silvae Sinicae

摘　　要：利用ESCA研究了麦秆表面在不同温度下和经氩离子刻蚀后Si元素含量的变化。结果表明 :在麦秆横切面上 ,Si元素含量中间层 (接近麦秆外表面 )含量较高 ;随着温度的升高 ,麦秆表面Si元素含量先降低而后增加 ,在选定的几个温度中 ,170℃和 2 2 0℃时Si含量最低 ;麦秆表面经氩离子刻蚀后 ,由外及里 ,随着氩刻的加深 ,Si含量呈现升高趋势。By means of ESCA, Si content of wheat straw surface was studied under different temperatures and sputtered by Ar +.In the cross section of wheat straw, Si content was the largest in the middle section. As temperature going up, Si content of wheat straw surface was rising after decrease. Of all selected temperatures, Si content was the smallest at 170℃ and 220℃. After surface sputtered by Ar +, Si content was rising with the depth from exterior to interior. The chemical surrounding of Si in wheat straw was closed to that of methyl silicone.

关 键 词：麦秆表面 硅含量 麦秆 刨花板 醛类胶粘剂 

分 类 号：TS653.5[轻工技术与工程] TS62