基于图像技术的电子元件表面缺陷检测方法  

Surface Defect Detection Method of Electronic Components Based on Image Technology

作　　者：鲍春宇 Bao Chunyu(Jiangsu Guannan Secondary Professional School,Lianyungang,China)

机构地区：[1]江苏省灌南中等专业学校,江苏连云港

出　　处：《科学技术创新》2025年第4期36-39,共4页Scientific and Technological Innovation

摘　　要：电子元件的表面缺陷的检测是确保电子产品质量的重要环节,现有的人工目检方法耗时费力,检测结果易受主观因素影响,在检测不同类型的电子元件表面缺陷时,难以满足现代生产线的需求,因此,提出了一种基于图像技术的电子元件表面缺陷检测方法。首先,采集电子元件表面图像并进行滤波去噪处理,阈值分割处理后的图像,将其划分为多个区域,基于图像技术提取划分后的电子元件图像表面缺陷特征,从而实现电子元件表面缺陷检测。通过实验可以证明,提出的检测方法在面对不同类型的表面缺陷时,检测率一直保持在98%以上,检测能力准确可靠,具有显著的优势。The detection of surface defects of electronic components is an important link to ensure the quality of electronic products.The existing manual eye inspection methods are time-consuming and laborious,and the detection results are easily affected by subjective factors.It is difficult to meet the needs of modern production lines when detecting surface defects of different types of electronic components.Firstly,the surface image of the electronic component is collected and processed by filtering and de-noising.The image after threshold segmentation is divided into multiple regions,and the surface defect features of the electronic component image after segmentation are extracted based on image technology,so as to realize the surface defect detection of the electronic component.It can be proved by experiments that the detection rate of the proposed method in the face of different types of surface defects has been maintained above 98%,the detection ability is accurate and reliable,and has a significant advantage.

关 键 词：图像技术 电子元件 缺陷检测 检测方法 特征提取 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术]