可见光干扰下复合绝缘子红外测试温度分布特征研究  

Temperature Distribution Characteristics of Composite Insulator Infrared Test Under Visible Light Interference

作　　者：周立玮 叶昊亮 李特 左周 杨勇 韩睿 刘书棋 ZHOU Liwei;YE Haoliang;LI Te;ZUO Zhou;YANG Yong;HAN Rui;LIU Shuqi(Wuhan Branch of China Electric Power Research Institute,Wuhan 430074,China;State Grid Zhejiang Electric Power Research Institute,Hangzhou 310014,China;State Key Laboratory of Power System Operation and Control(Department of Electrical Engineering,Tsinghua University),Beijing 100084,China)

机构地区：[1]中国电力科学研究院武汉分院,湖北武汉430074 [2]国网浙江省电力有限公司电力科学研究院,浙江杭州310014 [3]新型电力系统运行与控制全国重点实验室(清华大学电机系),北京100084

出　　处：《智慧电力》2025年第1期31-37,共7页Smart Power

基　　金：国家自然科学基金资助项目(52377150)。

摘　　要：近年来复合绝缘子红外图像识别发展迅速,其识别过程中不乏存在可见光干扰导致的绝缘子发热误判。首先,基于小波塔式分解算法,并结合希尔伯特变换,对现场在运复合绝缘子红外测试所提取的温度曲线进行处理,得到温度曲线中高频分量的包络线特征量。然后,对正常状态、阳光干扰、发热3种不同类型下的绝缘子红外图像特征量进行计算,并分析了其分布差异。结果表明,所提方法能有效识别出受阳光影响的绝缘子红外图像,也可筛选出受阳光干扰叠加发热的绝缘子红外图像,进行红外补测,防止因阳光干扰造成绝缘子发热漏判。In recent years,the infrared image recognition of composite insulator has developed rapidly.In the recognition process,visible light interference leads to the misjudgment of insulator heating.Firstly,the temperature curve extracted from the infrared test of the composite insulator in site operation is processed to obtain the envelope feature of high-frequency component of the temperature curve based on the wavelet pyramid decomposition algorithm combined with the Hilbert transform.Then the infrared image feature of the insulator under three different types of normal state,sunlight interference,and heating is calculated,and their distribution differences are analyzed.The results show that the proposed method can effectively identify the infrared image of the insulator affected by sunlight,screen out the infrared image of the insulator affected by sunlight interference and heating,and conduct infrared supplementary measurement to prevent the missing judgment of the insulator heating caused by sunlight interference.

关 键 词：复合绝缘子 温度曲线 小波 希尔伯特变换 红外图像 可见光干扰 发热 

分 类 号：TM216[一般工业技术—材料科学与工程]