基于ATE的高速存储器测试技术研究  

High Speed Memory Testing Methods Based on ATE

作　　者：谈元伟 李敬胶 常艳昭 苏洋[1] TAN Yuan-wei;LI Jing-jiao;CHANG Yan-zhao;SU Yang(The 58th Institute of China Electronics Technology Group Corporation)

机构地区：[1]中国电子科技集团公司第五十八研究所

出　　处：《中国集成电路》2024年第12期81-85,共5页China lntegrated Circuit

摘　　要：DDR3芯片是一种能最高支持1600 Mbps传输速率的高速存储器芯片,本文对该类芯片的功能描述,寄存器配置进行介绍,针对ATE(Automated Test Equipment,自动测试设备)测试机台设计了相应的硬件Loadboard,最后在ATE测试机台上进行了速度等级测试,测试结果验证了DDR3芯片在最高频率1600Mbps下的功能正确性,运用shmoo进行绘制眼图,分析DDR3的信号完整性,为DDR3芯片测试提供了一定的参考。DDR3 is a high-speed memory chip that can support up to 1600Mbps transmission rate.This article describes the functions and register configurations of this type of chip and designs corresponding peripheral circuits for ATE(Automated Test Equipment)testing machine.Finally,speed grade testing was conducted on the ATE testing machine,and the test results verified the correctness of the DDR3 chip’s function at the highest frequency of 1600Mbps.Shmoo was used to draw eye diagrams and analyze the signal integrity of DDR3,providing a certain refer-ence for DDR3 chip testing.

关 键 词：DDR3 寄存器编写 功能测试 自动测试设备 

分 类 号：TP3[自动化与计算机技术—计算机科学与技术]