由完全图对换生成的凯莱图的子结构分析  

Subnetwork reliability analysis of Cayley graphs generated by complete graphs

作　　者：胡晓敏 张淑蓉 曹婕 杨卫华 HU Xiaomin;ZHANG Shurong;CAO Jie;YANG Weihua(College of Mathematics,TaiyuanUniversity of Technology,Taiyuan 030024,Shanxi,China)

机构地区：[1]太原理工大学数学学院,山西太原030024

出　　处：《运筹学学报(中英文)》2024年第4期135-142,共8页Operations Research Transactions

基　　金：国家自然科学基金(No.12001394);山西省自然科学基金(Nos.202103021224058,202203021212484)。

摘　　要：关于网络子结构可靠性的研究,对高性能计算机系统的设计和研发有着重要的参考价值,同时为系统维护提供理论依据。本文从概率故障模型的方法得出了由完全图对换生成的凯莱图的子结构可靠性的上界和下界,并对理论结果进行了有效性分析。The research of subnetwork reliability is valuable for designation and development of high performance computer system,and provides theoretical basis for system maintenance.In this paper,we derive an upper bound and a lower bound of the subnetwork reliability in Cayley graphs generated by complete graphs under the probability fault model.The effectiveness of theoretical results are analyzed.

关 键 词：子结构可靠性 概率故障模型 凯莱图 

分 类 号：O157.5[理学—数学]