基于Chroma 3380P测试平台的高效FT测试方案  

Efficient FT Test Solution Based on Chroma 3380P Test Bench

作　　者：周中顺 夏蔡娟[1] 李连碧[1] 李飞飞 ZHOU Zhongshun;XIA Caijuan;LI Lianbi;LI Feifei(School of Science,Xi′an Polytechnic University,Xi′an 710048,China;Suzhou Feiying Microelectronics Co.,Ltd.,Suzhou 215123,China)

机构地区：[1]西安工程大学理学院,西安710048 [2]苏州飞盈微电子有限公司,江苏苏州215123

出　　处：《电子与封装》2025年第2期34-38,共5页Electronics & Packaging

基　　金：等离子体物理国家重点实验室项目(6142A04230302);陕西省重点研发计划项目(2023-YBGY-196);陕西数理基础科学研究项目(22JSY030、22JSY012);陕西省教育厅服务地方专项(22JC033)。

摘　　要：针对高端自动测试成本过高与芯片设计公司日益增长的测试需求不匹配这一现状,拟采用Chroma 3380 P型测试机和长川C6100TS三温平移式分选机组合,开发一种新型的高性能自动化测试系统。通过分析芯片测试的各项要求,设计了一个综合性的测试方案。搭建了完善的测试平台,充分融合了Chroma 3380P测试机的专业性能与长川C6100TS分选机的先进功能,同时通过外接高精度测试仪器,不仅实现了对芯片高效且精确的测试,还大大降低了测试成本,在ATE测试中具有通用性,为更多测试人员提供参考。In response to the mismatch between the high cost of high-end automatic testing and the growing testing needs of chip design companies,a new high-performance automatic testing system is proposed by combining Chroma 3380P testing machine and Changchuan C6100TS triple-temperature translational sorter.A comprehensive testing plan is designed by analyzing the various requirements of chip testing.A complete testing platform is built,which fully integrates the professional performance of Chroma 3380P testing platform and the advanced functions of Changchuan C6100TS sorter.At the same time,through external high-precision testing instruments,the efficient and accurate testing of chips is achieved,and the testing cost is significantly reduced.It has universality in ATE testing and provides a reference for more testers.

关 键 词：ATE Chroma 3380P FT测试 C6100TS三温平移式分选机 

分 类 号：TN407[电子电信—微电子学与固体电子学]