叠盖电极高性能SPRITE探测器  

The High Performance SPRITE with Overlap Contacts

作　　者：杨文运[1] 赵鹏[1] 余连杰[1] 朱惜辰[1] 

机构地区：[1]昆明物理研究所,云南昆明650223

出　　处：《激光与红外》2002年第6期416-418,共3页Laser & Infrared

摘　　要：由于扫出效应 ,载流子大量聚集在邻近电极的区域 ,但电极处的强复合作用使SPRITE读出区光生载流子数衰减很多 ,采用叠盖电极技术可以有效地阻止载流子在地电极处的快速复合 ,读出区中光生非平衡载流子总数为无叠盖电极时的 2 .18倍 ,输出信号大幅度提高。该技术对现有工艺的改变极小 ,是一种比较现实的提高SPRITE探测器性能的有效办法。叠盖电极用于SPRITE探测器 ,可明显提高性能。The sweep out effect makes the photo generated carrier accumulation in read out area of SPRITE.But the recombination at contacts decreases the number of photo generated carriers in read out area of SPRITE then the out signal,which will be reduced obviously using overlap contacts.The calculated results show that the signal increases up to a factor of 2.18.The overlap contacts used for SPRITE improve the performances of SPRITE considerably.

关 键 词：SPRITE 叠盖电极 红外探测器 光生载流子 

分 类 号：TN215[电子电信—物理电子学]