检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
作 者:Jingyu Wang Zhanfeng Guo Zhu Wang Zhengwei Liu Daixuan Wu He Tian
机构地区:[1]School of Integrated Circuits&Beijing National Research Center for Information Science and Technology(BNRist),Tsinghua University,Beijing 100084,China [2]Jiangsu Fengbo Equipment Technology Co.,Ltd,Wuxi 214000,China
出 处:《Journal of Semiconductors》2025年第3期1-4,共4页半导体学报(英文版)
基 金:supported by Xishan-Tsinghua University Industry University Research Deep Integration Special Project;by Beijing Natural Science Foundation–Xiaomi Innovation Joint Fund (Grant No. L233009);by National Natural Science Foundation of China under Grant No. 62374099。
摘 要:In recent years, significant research efforts have been made to optimize the lithography processes. Liu et al.[1](Nat.Commun, 2024, https://doi.org/10.1038/s41467-024-46743-5)pioneered a new multi-photon lithography technology in which light field and matter are co-confined, significantly exceeding the limitations of traditional lithography technology. In this news and views, we introduce this work to readers.
关 键 词:LITHOGRAPHY technology CONFINED
分 类 号:TN305.7[电子电信—物理电子学]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.7