基于Arrhenius模型的混合集成DC/DC高压电源储存寿命评估  

Storage Life Evaluation of Hybrid Integrated DC/DC High-Voltage Power Supply Based on Arrhenius Model

作　　者：黄吉 魏久富 程铭[1] HUANG JI;WEI Jiufu;CHENG Ming(China Electronics Technology Group Corporation No.24 Research Institute,Chongqing 400060,China)

机构地区：[1]中国电子科技集团公司第二十四研究所,重庆400060

出　　处：《电子与封装》2025年第4期13-17,共5页Electronics & Packaging

基　　金：模拟集成电路国家级重点实验室基金(9140C090407150C09045)。

摘　　要：储存寿命研究是评估电子设备可靠性及其使用寿命的重要方法之一。以某混合集成DC/DC高压电源为研究对象,在不同温度下进行高温加速储存寿命试验,记录包括输出电压、电压调整度和输入电流等在内的有关参数随储存时间的变化情况,引入评价参量,分析得到敏感参数;针对高温加速试验特点,选用Arrhenius模型对该电源开展常温下储存寿命评估。给出了该电源的加速寿命试验及储存寿命评估,为同类产品的储存寿命评估提供了相关参考,具有较强的理论及工程运用价值。The study of storage life is one of the important methods to evaluate the reliability and service life of electronic equipment.A hybrid integrated DC/DC high-voltage power supply is taken as the research object,and the high temperature accelerated storage life test is carried out at different temperatures.The variations of related parameters including output voltage,voltage regulation accuracy and input current with the storage time are recorded.The evaluation parameter is introduced to analyze and get the sensitive parameter.For the characteristics of high-temperature accelerated test,the storage life of the power supply at room temperature is evaluated by using the Arrhenius model.The accelerated life test and storage life evaluation of the power supply are given,which provides relevant reference for the storage life evaluation of similar products,and has strong theoretical and engineering application value.

关 键 词：DC/DC电源 高温加速试验 储存寿命 Arrhenius模型 

分 类 号：TN406[电子电信—微电子学与固体电子学]