一款汽车电子用MCU失效分析与对策  

Failure Analysis and Countermeasures of an MCU for Automotive Electronics

作　　者：王彬 赵志林 郭晶 WANG Bin;ZHAO Zhilin;GUO Jing(State Key Laboratory of Intelligent Vehicle Safety Technology,Wuxi 214072,China;China Key System&Integrated Circuit Co.,Ltd.,Wuxi 214072,China)

机构地区：[1]智能汽车安全技术全国重点实验室,江苏无锡214072 [2]中科芯集成电路有限公司,江苏无锡214072

出　　处：《电子与封装》2025年第4期77-83,共7页Electronics & Packaging

摘　　要：某车载电动尾门系统运行过程中,控制器直流电机运动时线缆产生的电磁辐射干扰到MCU芯片时钟路径,进一步引发内核Hardfault总线错误,导致运行故障,尾门无法到达指定位置。以MCU内核Hardfault异常为顶层事件建立故障树进行失效分析,成功定位了干扰源为直流电机线缆,干扰传播路径为空间辐射,干扰对象为MCU时钟路径,并通过故障场景复现验证了分析结果的正确性。最后从软、硬件角度提出了整改方法,对于电机运动控制系统的MCU失效分析与预防具有一定的参考借鉴价值。During the operation of a vehicle-mounted electric tailgate system,the electromagnetic radiation generated by the cable when the DC motor of the controller moves interferes with the clock path of the MCU chip,further causing a Hardfault bus error in the core,resulting in operational failure and inability of the tailgate to reach the designated position.A fault tree was established based on the Hardfault anomaly of the MCU core as the top-level event for failure analysis.The interference source was successfully located as the DC motor cable,the interference propagation path was spatial radiation,and the interference object was the MCU clock path.The correctness of the analysis results was verified through fault scenario reproduction.Finally,rectification methods were proposed from both software and hardware perspectives,which have certain reference value for MCU failure analysis and prevention in motor motion control systems.

关 键 词：MCU Hardfault 电磁辐射 故障树分析 直流电机 

分 类 号：TN406[电子电信—微电子学与固体电子学] TP368.1[自动化与计算机技术—计算机系统结构] U463.61[自动化与计算机技术—计算机科学与技术]