C波段低损耗高功率密封窗研制  

Development of a C-band Low Loss and High Power Sealing Window

作　　者：何擎 李傲楠 何云 HE Qing;LI Ao-nan;HE Yun(Jiayukang Technology Equipment(Shanghai)Co.Ltd.,Shanghai 201210,China)

机构地区：[1]嘉煜康科技设备(上海)有限公司,上海浦东201210

出　　处：《真空电子技术》2025年第2期13-16,共4页Vacuum Electronics

摘　　要：针对低损耗高功率微波密封窗的应用场景及现有技术缺陷,采用等效电路法计算出密封窗基本尺寸,并利用电磁仿真软件对尺寸进行优化。通过合理的工艺途径和试验方法,研制出一种C波段低损耗高功率微波密封窗。测试结果表明,方案达到预期目标。验证了理论计算和仿真优化相结合的合理性,为低损耗高功率密封窗研制和生产提供了指导。In view of the application scenario of low loss and high power microwave sealing windows and the defects of existing technologies,the basic size of the sealing window is firstly calculated by equivalent circuit method,and is then optimized by electromagnetic simulation software.A C-band low loss and high power microwave sealing window is developed by means of reasonable process approach and test method.The test results show that the scheme achieves the expected goal.The rationality of the combination of theoretical calculation and simulation optimization is verified,which provides guidance for the development and production of low loss and high power sealing windows.

关 键 词：微波 低损耗 高功率 隔离窗 

分 类 号：TN6[电子电信—电路与系统] TN632