CCD图像传感器失效模式及机理分析研究  

Research on failure mode and mechanism analysis of CCD image sensor

作　　者：蔡娜[1] 田智文[1] 季轩 周宇 李昊 张皓东[1] 李艳波 李姗姗 许明康 焦强 CAI Na;TIAN Zhiwen;JI Xuan;ZHOU Yu;LI Hao;ZHANG Haodong;LI Yanbo;LI Shanshan;XU Mingkang;JIAO Qiang(China Academy of Aerospace Standardization and Product Assurance,Beijing 100071,China)

机构地区：[1]中国航天标准化与产品保证研究院,北京100071

出　　处：《集成电路与嵌入式系统》2025年第5期60-65,共6页Integrated Circuits and Embedded Systems

摘　　要：本文结合CCD图像传感器技术发展情况,基于CCD图像传感器高可靠应用需求,系统分析了CCD的产品特性,梳理了CCD主要失效模式,并深入研究了CCD由于静电损伤和辐照环境下的失效机理,并开展了典型试验验证工作,给出了不同辐照条件下失效变化曲线,为CCD高可靠评估和开展失效分析提供了理论依据和试验数据,并为CCD产品高可靠应用提供技术指导。This article reviews the development of CCD image sensor technology.Based on the high reliability application requirements of CCD image sensors,it analyzed the product characteristics of CCD,categorizes the main failure modes,and conducted in-depth research on the failure mechanism of CCD due to electrostatic damage and irradiation.Furthermore,typical experimental verification work has been carried out,and failure variation curves under different irradiation conditions are presented.This study provides both theoretical foundations and experimental data for the high-reliability evaluation and failure analysis of CCD,thereby offering technical guidance for the high-reliability application of CCD products.

关 键 词：CCD 光电探测器 失效模式及机理 静电损伤 辐照效应 电离效应 

分 类 号：TP391[自动化与计算机技术—计算机应用技术] TN29[自动化与计算机技术—计算机科学与技术]