前端放大电路阵列测量系统的研制  

Studies on the testing system for the quality of the front-end amplifier array

作　　者：张田田[1] 李元景[1] 王汝赡[1] 刘云鹏[1] 贺恋平[1] 

机构地区：[1]清华大学工程物理系,北京100084

出　　处：《核电子学与探测技术》2003年第1期69-71,96,共4页Nuclear Electronics & Detection Technology

摘　　要：介绍了用于检测集装箱检查系统前端放大电路阵列性能指标的测试系统。该系统实现了对前端放大电路阵列的积分非线性、一致性和稳定性等指标的自动测试分析以及分析结果的回显和保存,达到了在应用现场及时准确测量其性能指标的目的。In this paper, deep researches have been carried out on designing a testing system for the quality of the frontend amplifier circuit. This system can be used to automatically test and analyze the indicator of INL, uniformity and stability. It also can playback and save the results. With the system further research on frontend amplifier circuits can be done easily. The software of this system is based on the Windows platform, and designed by the Visual C++ language. The structure of this software is clear, and it is easy to maintain and extend.

关 键 词：前端电放大路阵列 测试系统 数据采集系统 噪声 

分 类 号：TN722[电子电信—电路与系统]