一种有效评估桥接故障的I_(DDQ)可测试性分析算法  

I_(DDQ) testability analysis for bridge faults

作　　者：冯建华[1] 孙义和[1] 李树国[1] 

机构地区：[1]清华大学微电子学研究所,北京100084

出　　处：《清华大学学报（自然科学版）》2003年第1期140-143,共4页Journal of Tsinghua University(Science and Technology)

基　　金：国防重点实验室基金(514330202);国家自然科学基金资助项目(90207018)

摘　　要：鉴于传统的可测试性分析算法不能处理重汇聚扇出问题,该文提出了一种有效的评估电路桥接故障可测试性的IDDQ可测试性分析算法。这种算法是基于给电路中每个门施加基本矢量集的概率进行的。开始在原始输入端采用单值标记,通过电路分级和从原始输入端传播标记集可识别重汇聚扇出门,然后采用反向蕴含过程计算重汇聚门基本矢量的概率值,进行重汇聚扇出点的评价。实验结果表明这种算法可获得较精确的可测试性分析结果。Reconvergent fanout has not been well handled in traditional testability analysis algorithms. This paper presents an efficient IDDQ testability analysis algorithm to evaluate a circuit bridge fault testability. The algorithm is applies the probability of a set of essential vectors to each gate in the circuit. Reconvergent fanout is identified by leveling the circuits and propagating forward set labels from the primary inputs through the circuit with unique initial labels on each primary input. The algorithm for evaluating reconvergent fanout points then uses a backward implication algorithm to calculate the essential vector probabilities for the reconvergent gates. Experimental results show that accurate testability analysis results can be achieved.

关 键 词：桥接故障 IDDQ可测试性分析算法 超大规模集成电路 重汇聚扇出 反向蕴含 基本矢量集 电路测试 

分 类 号：TN470.7[电子电信—微电子学与固体电子学]