光电子能谱在钒酸钇晶体生长中的应用  

Application of photoelectron spectroscopy to YVO4 crystal growth

作　　者：夏峥嵘[1] 杨坤涛[1] 陈四海 

机构地区：[1]华中科技大学光电子工程系 [2]福建华科光电有限公司

出　　处：《华中科技大学学报（自然科学版）》2003年第2期30-32,共3页Journal of Huazhong University of Science and Technology(Natural Science Edition)

基　　金：国家自然科学基金资助项目 ( 60 1 0 60 0 3 )

摘　　要：应用光电子能谱分析了钒酸钇 (YVO4)多晶料与单晶之间的关系 ,成功生长出低缺陷的YVO4晶体 ,并对晶体进行检测 .由检测结果得出 ,YVO4晶体的小角晶界 ,散射中心等缺陷与多晶料的Y ,V质量比有密切的关系 ,晶体的外形变形。The liquid phase method was used to synthesize the polycrystalline materials. Czochralski method is one of the most successful technologies in the growth of yttrium vanadate (YVO 4) crystal. Photoelectron spectroscopy was employed to analyze the relation of the yttrium vanadate between the polycrystalline materials and single crystal. YVO 4 crystals with low imperfection were successfully produced.

关 键 词：晶体生长 光电子能谱 钒酸钇晶体 晶体缺陷 双折射晶体 晶界 散射中心 

分 类 号：O781[理学—晶体学] O734