基于遗传算法的PCB互连测试矢量生成研究与实现  

The Study and Realization of the Optimization of PCB Interconnection Test Sets on the Basis of Genetic Algorithm

作　　者：卢静[1] 

机构地区：[1]浙江教育学院,浙江杭州310012

出　　处：《浙江教育学院学报》2003年第1期49-54,共6页Journal of ZHEJIANG Education Institute

摘　　要：对运用遗传算法来生成PCB和MCM互连测试矢量集这一过程进行了研究,并对编码策略、目标函数等问题进行了讨论,提出了故障模拟方案,得出一种高效混合并行遗传算法,最后还通过实验验证了该方法比一般算法更有效。The process of interconnection test sets generations of PCB and MCM are studied , and the problems of the coding strategy and the fitness function are discussed in the paper . Then put forward is a scheme on faults simulation, and obtained is an effective parallel GA. GA is more effective than normal algorithm and it is verified on experiments.

关 键 词：遗传算法 边界扫描 互连测试 测试矢量 故障模拟 目标函数 

分 类 号：O242.23[理学—计算数学]