全二维气相色谱谱图基线校正方法的研究  

Baseline Calibration of Comprehensive Two-dimensional Gas Chromatogram

作　　者：孔宏伟[1] 路鑫[1] 阮春海[1] 杨军[1] 肖珂[1] 杨青[1] 许国旺[1] 

机构地区：[1]中国科学院大连化学物理研究所,国家色谱研究分析中心,大连116011

出　　处：《分析化学》2003年第4期409-413,共5页Chinese Journal of Analytical Chemistry

基　　金：国家自然科学基金资助项目 (No .2 0 175 0 2 8)

摘　　要：拟根据全二维气相色谱谱图的特点 ,以第一周期的信号为初值 ,通过计算各周期 (第二维 )谱图的基线水平及噪声 ,去除特异值后 ,利用三次样条分析对基线进行重构 ,达到对全谱图的基线校准。以石脑油样品的全二维气相色谱分析谱图为例进行评价 ,校准后基平面的标准偏差为 0 .1 1 4 ,系统漂移得到良好的扣除 ,同一谱图数据用商品化的Zoex软件处理 ,基平面的标准偏差为 0 .61 4 ,表明本文的方法具明显优越性 。Based on the characteristic of comprehensive two-dimensional gas chromatography (GC x GC), the baseline level and its noise of the chromatograms in every period (i.e. each second dimensional chromatogram) were detected by using the signal in first period as initial value. The wrong baseline values were removed by panata statistics. The null values which has not been defined and detected correctly were rebuilt by the cubic spline analysis. To evaluate the new method, a comprehensive two-dimensional gas chromatogram of naphtha was handled. The results show the proposed method can successfully be used to detect and deduct baseline. The standard deviation of new baseline plane is 0.114, which is much better than that (0.614) from the commercial ZOEX software. This method is very useful to achieve the correct peak volumes in GC x GC.

关 键 词：全二维气相色谱 谱图 基线校正 三次样条 基线漂移 分析 

分 类 号：O657.7[理学—分析化学]