一种研究电子元器件失效规律的新方法  

A New Research Method on the Reliability of GMCounter Tubes

作　　者：谢波[1] 怀光利[1] 张国明[1] 陈洪涛[1] 张皓[1] 李继源[1] 

机构地区：[1]防化研究院第二研究所,北京102205

出　　处：《电子产品可靠性与环境试验》2003年第2期19-23,共5页Electronic Product Reliability and Environmental Testing

摘　　要：提出并采用了一种研究GM管失效规律的新方法,利用该方法研究了两种GM管的失效规律,并据此确定其使用寿命为18～20年,在此期间的失效率分别为5×10-6/h和4×10-6/h。The reliability of GM counter tubes is described by useful time before failure - life and failure rate during life. A new method to study the failure regularity of GM counter tubes was presended. Using this method, the failure regularity of two kinds of GM counter tubes are studied. According to the failure regularity, the useful life and failure rate is determined. The conclusion is that the useful life is 18 -20 years and the failure rate is 5 × 10-6/h and 4 × 10 6/h respectively .

关 键 词：电子元器件 失效规律 GM计数管 使用寿命 可靠性 

分 类 号：TN606[电子电信—电路与系统]