Ag-TCNQ薄膜电双稳态特性的XPS研究  

XPS Study of Ag-TCNQ Electrical Bistable Films

作　　者：张群[1] 孔令柱[1] 张强基[1] 王伟军[1] 华中一[1] 

机构地区：[1]复旦大学材料科学系,上海200433

出　　处：《真空科学与技术》2003年第3期169-172,共4页Vacuum Science and Technology

摘　　要：本文采用X光电子谱仪 (XPS)研究了Ag TCNQ薄膜的电双稳态特性。对TCNQ粉末、热处理前后的TCNQ薄膜及Ag TCNQ薄膜作了分析。结果发现 ,真空蒸镀及大气环境中热处理不会引起TCNQ化学状态的变化 ,而热处理会促使Ag与TCNQ发生反应 ,薄膜电双稳态特性的优劣则与反应程度有关。Electrical bistable characteristics in Ag TCNQ thin films was investigated with X ray photoelectron spectroscopy(XPS).TCNQ powder,TCNQ thin films and Ag TCNQ thin films with and without heat treatment were prepared and characterized.The results show that TCNQ keeps at the same chemical states during the processes of vacuum deposition and post heat treatment moderately in atmosphere.The reactions between Ag and TCNQ are accelerated by heat treatment,and the electrical switching properties are affected by the reaction degree.The possible mechanism has been briefly discussed.

关 键 词：XPS AG-TCNQ 电双稳态特性 化学态 

分 类 号：O485[理学—固体物理]