(Zr_(0.7)Sn_(0.3))TiO_4陶瓷介电性能与工艺参数关系的回归分析  

Regression Analysis of the Relationship between Dielectric Properties and Processing Parameters of (Zr_0.7Sn_0.3)TiO_4 Ceramics

作　　者：王国庆[1] 吴顺华[1] 赵玉双[1] 刘丹丹[1] 

机构地区：[1]天津大学电子信息工程学院,天津300072

出　　处：《无机材料学报》2003年第4期892-898,共7页Journal of Inorganic Materials

摘　　要：用回归分析方法得到了(Zr0.7Sn0.3)TiO4陶瓷的介电性能ε和δ与其工艺参数(CuO、ZnO)和玻璃的添加量(分别为x1、x2、x3 wt%)及预烧和烧结温度(分别为x4×103和x5×103℃)之间的定量关系:ε＝10.9731-1.4559x1+9.9154x2+1.9776x3-3.3160x22-0.2286x23-200.1697x24-161.9102x25+375.1160x4x5;lg(tanδ)＝-38.5876-0.6452x2+0.1235x3+31.2221x4+30.3861x5+0.1100x21+0.2077x22-0.0106x23-27.4317x4x5.能对给定工艺参数下的介电性能进行预测,并能确定满足特定介电性能的工艺参数,有助于加快电子陶瓷材料的研究.Regression analysis was used to obtain the quantitative relationship between the dielectric properties (epsilon and tandelta) and processing parameters of (Zr0.7Sn0.3)TiO4 ceramics, which include doping rates of CuO, ZnO and glass (x(1), x(2) and x(3) wt%, respectively), the calcination and sintering (x(4) x 10(3) and x(5) x 10(3)degreesC, respectively) temperatures: epsilon = 10.9731 - 1.4559x(1) + 9.9154x(2) + 1.9776x(3) - 3.3160x(2)(2) - 0.2286x(2)(3) - 200.1697x(2)(4) - 161.9102x(2)(5) + 375.1160x(4)x(5); lg(tandelta) = - 38.5876 - 0.6452x(2) + 0.1235x(3) + 31.2221x(4) + 30.3861x(5) + 0-1100x(1)(2) + 0.2077x(2)(2) - 0.0106x(3)(2) - 27.4317X(4)X(5). It is possible to predict the dielectric properties under given processing parameters, and to determine the processing parameters that satisfy certain dielectric properties. This helps to accelerate the investigation of electric ceramic materials.

关 键 词：回归分析 (Zr0.7Sn0.3)TiO4 介电性能 

分 类 号：TQ174[化学工程—陶瓷工业]