Backward Time Difference Collocation Method and Error Analysis for the Semiconductor Problem  

Backward Time Difference Collocation Method and Error Analysis for the Semiconductor Problem

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作  者:刘蕴贤 

机构地区:[1]School of Mathematics and System Science,Shandong University,Jinan,250100

出  处:《Northeastern Mathematical Journal》2003年第1期9-18,共10页东北数学(英文版)

基  金:The NNSF.MTYF(10126029)of China and the YF of Shandong University.

摘  要:Collocation method is put forward to solve the semiconductor problem with heat-conduction, whose mathematical model is described by an initial and boundary problem for a nonlinear partial differential equation system. One elliptic equation is for the electric potential, and three parabolic equations are for the electron concentration, hole concentration and heat-conduction. Using the prior estimate and technique of differential equations, we obtained almost optimal error estimates in L2.Collocation method is put forward to solve the semiconductor problem with heat-conduction, whose mathematical model is described by an initial and boundary problem for a nonlinear partial differential equation system. One elliptic equation is for the electric potential, and three parabolic equations are for the electron concentration, hole concentration and heat-conduction. Using the prior estimate and technique of differential equations, we obtained almost optimal error estimates in L2.

关 键 词:semiconductor device HEAT-CONDUCTION collocation method error estimate 

分 类 号:O241.82[理学—计算数学] TN30[理学—数学]

 

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