智能导纳物位计设计  

Design of Intelligent Conductance Style Material Level Gauge

作　　者：田亮[1] 刘鑫屏[1] 苏杰[1] 

机构地区：[1]华北电力大学仪表动力工程系,河北保定071003

出　　处：《仪表技术与传感器》2003年第9期12-12,30,共2页Instrument Technique and Sensor

基　　金：国家电力公司科技项目资助 ;合同编号为SPKJ0 0 2 -1 6。

摘　　要：在测量粉状或颗粒状固体物料的物位方面,导纳式料位计有灵敏度高、适应性广的优点。但在应用中存在物料在探头处黏结导致测量失效和物质介电特性变化导致的零点漂移的问题,提出导纳式料位计的改进设计方案,可以防止物料黏结导致的测量失效,并且仪表采用单片机,可以对零点和阈值进行自校准,提高了测量的准确度。In the aspect of measuring the material level of the pulverous or granular solid medium the conductance material level gauge has the merit of high sensitivity and fine adaptability.Whereas during the application,there is the problem that the material felt on the measurement probe,which caused the failure of measurement,and that the changing of dielectric coefficient caused zero excursion.To solve this problem,bring forward a design scheme that is a kind of ameliorated material level gauge.This design scheme can prevent the failure caused by the material felt and the instrument adopted MCU.This design scheme can also calibrate by itself aiming at zero and sensitivity,and the veracity of measurement is improved

关 键 词：物位测量 导纳 单片机 物位计 设计 零点漂移 自校准 

分 类 号：TH816[机械工程—仪器科学与技术] TP216[机械工程—精密仪器及机械]