叠盖电极技术在SPRITE探测器上的应用  

The Practical Application of the Overlap-contacts Technology to SPRITE Detectors

作　　者：余连杰[1] 杨文运[1] 赵鹏[1] 朱远波 朱惜辰[1] 

机构地区：[1]昆明物理研究所,云南昆明650223 [2]驻昆明地区军事代表室

出　　处：《激光与红外》2003年第5期331-334,共4页Laser & Infrared

摘　　要：文中主要介绍了叠盖电极技术在SPRITE探测器上的实际应用,并给出了具体实验结果。选择适当的叠盖电极尺寸可以使SPRITE的响应率Rv提高一倍以上,探测率D 普遍提高30%左右,高的可达80%。实验结果表明,叠盖电极技术明显地提高了SPRITE器件的性能,是一种简便的提高SPRITE性能的新途径。The practical application of the overlapcontacts technology to SPRITE detectors was introduced and the specific results of the experiment were provided in the paper. The responsibility Rv of SPRITE with the applicable length of the overlapcontacts can be doubled and the detectivity D* can be improved about 30%, even 80%. Experimentally, the performance of SPRITE with overlap contacts was markedly increased, so that the overlapcontactstechnology is an effective way to improve the performance of SPRITE.

关 键 词：叠盖电极 SPRITE器件 碲镉汞 红外探测器 结构原理 

分 类 号：TN215[电子电信—物理电子学]