SIFT描述子高效扫描控制电路结构设计  

Efficient Sampling Control Circuit Design of Descriptors in SIFT

作　　者：李茜[1] 桑红石[1] 张静[1] 

机构地区：[1]华中科技大学图像识别与人工智能研究所,湖北武汉430074

出　　处：《微电子学与计算机》2014年第9期54-57,共4页Microelectronics & Computer

摘　　要：尺度不变特征变化(SIFT)算法是目前在图像配准领域最为活跃的算法之一,但描述子特征向量描述部分的计算复杂度特别高,现有硬件实现方法的数据吞吐率仅为50%.为了克服该瓶颈,提出了一种新型的描述子特征向量扫描控制机制,占用硬件资源少,显著提高有效像素点的采样率.在硬件耗用仅提高1.16%的情况下,平均吞吐率达到77%,与传统方法相比吞吐率提高了54%.Scale-invariant feature transform(SIFT)algorithm is one of the most dynamic algorithms which applied in image matching field.However,the computation complexity of descriptors is especially high.According to existing design method,the throughput rate of the whole module is only 50%.To conquer this bottleneck,we present a new sample method of descriptors in SIFT.The hardware cost of the structure is both small and worthwhile,since the sampling rate of the effective pixels is increased significantly.With 1.16% extra hardware cost,the average throughput reaches 77%.Compared with traditional method,the throughput improved 54%.

关 键 词：SIFT 描述子 吞吐率 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术]