VCS OBC技术的评估  

Evaluation of VCS Observed Coverage

作　　者：Etienne Caclin Bertrand Deleris Volker Wahl 

机构地区：[1]Motorola半导体

出　　处：《电子设计应用》2004年第1期20-22,27,共4页Electronic Design & Application World

摘　　要：设计验证已经成为半导体芯片设计过程所面临的主要难题之一。为确保芯片正确运行,除了验证芯片各方面功能外,如何测定测试的质量以及测试包覆盖芯片功能范围等问题也变得日益重要。这项挑战可以通过应用VCS OBC技术得到解决,本文将对此技术进行详细探讨。Verification of a design is today a major challenge in the semiconductor chip design cycle. To assure that thechip will be working correctly in the application, apart from the challenge of generating tests for various functions,the challenge gets more and more important that how to measure the test quality and how much the functionalityis covered. Observed Coverage in VCS can deal with this challenge and is discussed in this article.

关 键 词：半导体芯片 VCS OBC 评估 单片系统芯片 

分 类 号：TN303[电子电信—物理电子学]