汉语失写症与脑损害部位关系的研究  

A study on the relation between the location of brain damage and agraphia of Chinese

作　　者：谢秋幼[1] 刘晓加[1] 李卫平[1] 吕庆文[2] 

机构地区：[1]第一军医大学附属南方医院神经内科,广州510515 [2]第一军医大学医学生物工程系解放军医学图像重点实验室

出　　处：《中华内科杂志》2003年第3期173-176,共4页Chinese Journal of Internal Medicine

基　　金：国家自然科学基金资助项目(39870 2 6 8)

摘　　要：目的　了解汉语失写症与脑损害部位的关系。方法　采用汉语失语检查法和汉语失写检查法测试口语和书写能力并区分类型。对患病的头颅CT/MRI进行标准化后二维叠加、三维重建 ,并与非失写对照相减 ,直观显示病灶。结果　左侧半球损害 48例 ,其中失语 30例 ,失写 32例 ,后者中纯失写 1例 ,失读并失写 1例 ;右侧半球损害 1 5例 ,其中失语、失写 3例。二维图像叠加及三维重建显示 :失语性失写病灶较集中的区域为额顶叶深部白质。惰性失写主要集中在外侧裂的前方、从额中下回向后部延伸。镜像书写则分散于丘脑、基底节附近。结论　汉语失写症与脑损害部位有一定的对应关系 。Objective To investigate the relation between the location of brain damage and Chinese agraphia. Methods Aphasia Battery of Chinese (ABC) and Chinese Agraphia Battery (CAB) were used to examine the ability of oral language and writing. Different types of aphasia and agraphia were detected. Computerized image processing technology was used to standardize and reconstruct the skull CT/MRI images. The results substracted from the normal controls were shown directly. Results 48 patients had lesions on the left brain among them 30 were aphasic and 32 were agraphic. 15 had lesions on the right brain, among them 3 were aphasic and agraphic. The image processing results showed that the nidi of aphasic agraphia located on the left deep albae of frontal and parietal lobe, the nidi of persistent agraphia located on the posterior parts of the left 1st and 2nd gyrus of frontal lobe and the nidi of mirror agraphia were dispersed near the left basal ganglion and thalamus. Conclusions It is found that there is a relationship between Chinese agraphia and the location of brain damage. Some parts may be responsible for some special writing ability.

关 键 词：汉语失写症 脑损害 神经心理学 病理机制 神经影像技术 

分 类 号：R741[医药卫生—神经病学与精神病学]