扫描法固体低温比热测量系统及其分析  

THE SYSTEM OF SOLID SPECIFIC HEAT MEASUREMENT WITH SCANNING METHOD AND ITS ANALYSIS

作　　者：周承浩 张义炳[1] 萨加特 阮美萍 金汴骏 

机构地区：[1]上海科学技术大学

出　　处：《应用科学学报》1992年第1期49-52,共4页Journal of Applied Sciences

摘　　要：介绍了扫描法测量固体低温比热的实验系统及其出现的问题和解决方法.用此实验系统对纯度为99.7%电介铜的比热测量结果表明,它与美国国家标准参考数据相比,在80K—260K范围内偏差小于7%.This paper introduced and analysed the experiment system for measuring solid specific heat with the scanning method. Using the experiment system, we measured the specific heat of the copper of 99.7% purity. Its data showed its deviation between 80K and 260K is less than ,l% from the National Standard Reference Data System.

关 键 词：扫描法 比热 测量 固体 微机 

分 类 号：O482.2[理学—固体物理]