原子力显微术轻敲模式中探针样品接触过程及相位衬度研究  

Study of tip-sample contact process and phase contrastin tapping mode atomic force microscopy

作　　者：王晓平[1] 刘磊[2] 胡海龙[2] 张琨[2] 

机构地区：[1]中国科学技术大学物理系,合肥230026 [2]中国科学技术大学结构分析实验室,合肥230026

出　　处：《物理学报》2004年第4期1008-1014,共7页Acta Physica Sinica

基　　金：国家自然科学基金 (批准号 :1 0 2 74 0 76 );国家自然科学基金重点项目 (批准号 :50 1 32 0 30 )资助的课题~~

摘　　要：借助简单的有阻尼受迫振子模型 ,研究了原子力显微术轻敲模式中探针与样品接触时间tc、样品的表面形变Dz和相位衬度对探针设置高度zc 及样品杨氏模量Es 的依赖关系 .结果发现 ,tc 与Dz 均随Es 及zc 的增大而减小 ,同时探针与样品作用过程伴随很小的能量耗散 .对轻敲过程中相移量 φ的研究表明 ,Es 较大的样品有较小的 φ ,且 φ随zc 的变化比Es 较小的样品明显 .The tapping-mode atomic force microscope (TM-AFM) is a very useful tool to inv estigate the morphology and the physical properties of sample surface. The tip- sample contact process and phase contrast of TM-AFM is studied by numerical sim ulation. The cantilever-tip ensemble is simply modeled as a damped harmonic osc illator driven by an actuator. The effects of tip-sample distance z c and the Young modulus of sample E s on the contact time between the tip and s ample t c, the deformation of the sample surface D z and the contrast of phase image have been investigated. The results show that both t c and D z decrease with increasing E s or z c. A little amount of ene rgy dissipation can occur when the tip is tapping on the sample. Moreov er, when z c is fixed, the phase shift of the sample with large E s is found more remarkable than that with small E s. The experimental observati on of phase image performed on Au film dispersed with Au clusters supports the s imulation results.

关 键 词：原子力显微术 轻敲模式 相位衬度 探针样品 阻尼受迫振子模型 杨氏模量 能量耗散 

分 类 号：O562[理学—原子与分子物理]