ARINC659总线接口组件抗单粒子翻转加固设计及试验验证  

Design and Experiment of Single Event Upset Hardened ARINC659 Bus Interface Components

作　　者：汪路元[1] 刘伟伟[1] 徐轲[1] 

机构地区：[1]北京空间飞行器总体设计部,北京

出　　处：《国际航空航天科学》2017年第2期90-98,共9页Journal of Aerospace Science and Technology

基　　金：国家自然科学基金资助项目(91438102),空间信息网络业务特征与流量分析理论研究。

摘　　要：ARINC659是一种标准的多点串行通信总线,具有通用、高效、高可靠等优点,已经越来越多地成为航天器综合电子系统计算机背板总线的理想选型。本文在对ARINC659总线架构和工作机制研究的基础上,对ARINC659总线标准背板总线组件在空间环境应用下的单粒子翻转效应敏感环节进行识别,并提出了有针对性的抗单粒子翻转加固设计措施,最后通过地面模拟试验对抗单粒子翻转加固措施的正确性和有效性进行了验证。试验表明进行单粒子翻转加固设计后的ARINC659总线接口组件满足辐照环境下的应用要求,为ARINC659总线应用于航天领域奠定了基础。ARINC659 as a standard multipoint serial communication bus, and with the advantage of more general, high efficiency and reliability, has increasingly become the idea selection of backplane bus within the computer of spacecraft avionics system. This paper based on the study of ARINC659 bus architecture and underlying communication mechanism, identifies the sensitive of single event upset for ARINC659 bus interface components applied to space radiation environment, and a set of targeted reinforcement design is put forward for single event upset hardened. Finally, the correction and validity of the reinforcement design are verified by ground simulation experiment, which shows that ARINC659 bus interface components after reinforcement design meet the application in the radiation environment and provide the basis for the application of ARINC659 bus in aerospace.

关 键 词：背板总线 ARINC659 单粒子翻转 综合电子 

分 类 号：TP33[自动化与计算机技术—计算机系统结构]