On Robustness of a Sequential Test for Scale Parameter of Gamma and Exponential Distributions  

作　　者：Parameshwar V. Pandit Nagaraj V. Gudaganavar 

机构地区：[1]不详

出　　处：《Applied Mathematics》2010年第4期274-278,共5页应用数学（英文）

摘　　要：The main aim of the present paper is to study the robustness of the developed sequential probability ratio test (SPRT) for testing the hypothesis about scale parameter of gamma distribution with known shape parameter and exponential distribution with location parameter. The robustness of the SPRT for scale parameter of gamma distribution is studied when the shape parameter has undergone a change. The similar study is conducted for the scale parameter of exponential distribution when the location parameter has undergone a change. The expressions for operating characteristic and average sample number functions are derived. It is found in both the cases that the SPRT is robust only when there is a slight variation in the shape and location parameter in the respective distributions.The main aim of the present paper is to study the robustness of the developed sequential probability ratio test (SPRT) for testing the hypothesis about scale parameter of gamma distribution with known shape parameter and exponential distribution with location parameter. The robustness of the SPRT for scale parameter of gamma distribution is studied when the shape parameter has undergone a change. The similar study is conducted for the scale parameter of exponential distribution when the location parameter has undergone a change. The expressions for operating characteristic and average sample number functions are derived. It is found in both the cases that the SPRT is robust only when there is a slight variation in the shape and location parameter in the respective distributions.

关 键 词：GAMMA Distribution SEQUENTIAL Probability Ratio Test Operating Characteristic FUNCTION AVERAGE SAMPLE Number FUNCTION ROBUSTNESS 

分 类 号：O1[理学—数学]