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出 处:《Journal of Analytical Sciences, Methods and Instrumentation》2018年第3期37-47,共11页分析科学方法和仪器期刊(英文)
摘 要:CuKβ radiation with a wavelength of λ = 1.3923 ? is recommended for crystal structure determination from X-ray powder diffraction using the Rietfeld method. A highly sensitive image plate detector is able to collect enough intensity to record a brilliant X-ray powder pattern in a reasonable time, compared to CuKα1 radiation used today. Especially atomic displacement coefficients could be determined more precisely with the much greater number of reflections recorded. A double-radius Guinier camera attached to a micro-focus rotating anode tube ensures increased brilliance besides high resolution. A simple construction specification is presented to make smart cylindrically bent Ge(111) or Si(111) X-ray monochromators that deliver focused CuKβ radiation. The highly linear response of image plate detectors allows removing of fluorescence radiation simply as background of the pattern. The proposed equipment is a cost-efficient alternative to a liquid gallium-metal-jet X-ray source with maximum power load and a similar wavelength of λ(GaKα1) = 1.34013 ?.CuKβ radiation with a wavelength of λ = 1.3923 ? is recommended for crystal structure determination from X-ray powder diffraction using the Rietfeld method. A highly sensitive image plate detector is able to collect enough intensity to record a brilliant X-ray powder pattern in a reasonable time, compared to CuKα1 radiation used today. Especially atomic displacement coefficients could be determined more precisely with the much greater number of reflections recorded. A double-radius Guinier camera attached to a micro-focus rotating anode tube ensures increased brilliance besides high resolution. A simple construction specification is presented to make smart cylindrically bent Ge(111) or Si(111) X-ray monochromators that deliver focused CuKβ radiation. The highly linear response of image plate detectors allows removing of fluorescence radiation simply as background of the pattern. The proposed equipment is a cost-efficient alternative to a liquid gallium-metal-jet X-ray source with maximum power load and a similar wavelength of λ(GaKα1) = 1.34013 ?.
关 键 词:X-RAY DIFFRACTION Rietfeld Analysis CuKβ RADIATION Guinier Method FOCUSING MONOCHROMATORS X-RAY DIFFRACTION Equipment Construction
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