国家自然科学基金(U1330114)

作品数:2被引量:2H指数:1
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相关作者:潘建华陈万军更多>>
相关机构:电子科技大学中国电子科技集团第五十八研究所更多>>
相关期刊:《Chinese Physics B》《电子与封装》更多>>
相关主题:MOSIGBTCONTROLLED单粒子烧毁THYRISTOR更多>>
相关领域:电子电信更多>>
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High dV/dt immunity MOS controlled thyristor using a double variable lateral doping technique for capacitor discharge applications被引量:1
《Chinese Physics B》2014年第7期691-696,共6页陈万军 孙瑞泽 彭朝飞 张波 
supported by the National Natural Science Foundation of China(Grant No.U1330114);the Advance Research Program,China(GrantNo.51308030407);the Opening Project of Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory,China(Grant No.ZHD201201)
An analysis model of the dV/dt capability for a metal-oxide-semiconductor (MOS) controlled thyristor (MCT) is developed. It is shown that, in addition to the P-well resistance reported previously, the existence of...
关键词:MOS controlled thyristor capacitor discharge 
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