supported by the National Natural Science Foundation of China(Grant No.U1330114);the Advance Research Program,China(GrantNo.51308030407);the Opening Project of Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory,China(Grant No.ZHD201201)
An analysis model of the dV/dt capability for a metal-oxide-semiconductor (MOS) controlled thyristor (MCT) is developed. It is shown that, in addition to the P-well resistance reported previously, the existence of...