国家重点基础研究发展计划(s2010CB631005)

作品数：6被引量：19H指数：3
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相关期刊：《Science China(Physics,Mechanics & Astronomy)》更多>>
相关主题：SEMRESIDUAL_STRESSMICRODICNANO-SCALE更多>>
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A micro-scale strain rosette for residual stress measurement by SEM Moiré method被引量：6
《Science China(Physics,Mechanics & Astronomy)》2014年第4期716-722,共7页ZHU RongHua XIE HuiMin ZHU JianGuo LI YanJie CHE ZhiGang ZOU ShiKun 
supported by the National Basic Research Program of China(Grant Nos.2010CB631005 and 2011CB606105);the National Natural Science Foundation of China(Grant Nos.90916010,11172151 and 11232008);Specialized Research Fund for the Doctoral Program of Higher Education(Grant No.20090002110048);Tsinghua University Initiative Scientific Research Program
In this paper,a new method combining focused ion beam(FIB)and scanning electron microscope(SEM)Moirétechnique for the measurement of residual stress at micro scale is proposed.The FIB is employed to introduce stress ...
关键词：residual stress focused ion beam SEM Moiré method ring-core method random phase-shifting 
Fabrication technique of micro/nano-scale speckle patterns with focused ion beam被引量：7
《Science China(Physics,Mechanics & Astronomy)》2012年第6期1037-1044,共8页LI YanJie XIE HuiMin LUO Qiang GU ChangZhi HU ZhenXing CHEN PengWan ZHANG QingMing 
supported by the National Basic Research Program of China (Grant Nos.2010CB631005 and 2011CB606105);the National Natural Science Foundation of China (Grant Nos.90916010 and 11172151);the Specialized Research Fund for the Doctoral Program of Higher Education (Grant No. 20090002110048)
The fabrication technique of micro/nano-scale speckle patterns with focused ion beam (FIB) system is studied for digital image correlation (DIC) measurement under a scanning electron microscope (SEM).The speckle patte...
关键词：speckle pattern digital image correlation （DIC） micro/nano-scale focused ion beam （FIB） scanning electron microscope （SEM） 
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