Supported by National Natural Science Foundation of China(11127507,10925523)
Megaelectronvolt ultrafast electron diffraction(UED) is a promising detection tool for ultrafast processes.The quality of diffraction image is determined by the transverse evolution of the probe bunch. In this paper...
Supported by National Natural Science Foundation of China(11127507,11375097,11375098);National Basic Research Program of China(973 Program)(2011CB808302)
Increasing the peak brightness is beneficial to various applications of the Thomson scattering X-ray source. A higher peak brightness of the scattered X-ray pulse demands a shorter scattering electron beam realized by...