IMPRINT

作品数:52被引量:57H指数:4
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相关作者:王凯张波刘莹更多>>
相关机构:浙江工业大学绵阳师范学院北京印刷学院更多>>
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相关基金:国家自然科学基金国家重点基础研究发展计划国家教育部博士点基金广东省自然科学基金更多>>
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Imprint of transient electron localization in H2+ using circularly-polarized laser pulse
《Chinese Physics B》2020年第12期221-226,共6页Jianghua Luo Jun Li Huafeng Zhang 
Project supported by the National Key Research and Development Program of China(Grant No.2018YFB1801904);the National Natural Science Foundation of China(Grant No.12075036);the Open Research Fund of National Mobile Communications Research Laboratory,Southeast University(Grant No.2019D14)。
Photoelectron momentum distribution of hydrogen molecular ion in a circularly polarized laser pulse is calculated by solving the three-dimensional time-dependent Schrodinger equation(3D-TDSE).At the intermediate inter...
关键词:strong-field ionization ultrafast phenomena photoelectron spectrum 
Application of millimeter-sized polymer cylindrical lens array concentrators in solar cells被引量:1
《Chinese Physics B》2018年第5期551-557,共7页Yao-Ju Zhang Yi-Jie Li Jie Lin  Chao-Long Fang Si-Yuan Liu 
Project supported by the Natural National Science Foundation of China(Grant No.61377021)
A unique method is proposed to encapsulate solar cells and improve their power conversion efficiency by using a millimeter-sized cylindrical lens array concentrator. Millimeter-sized epoxy resin polymer(ERP) cylindr...
关键词:millimeter-sized cylindrical array concentrator silicon solar cells high-efficiency soft imprint method 
Synergistic effects of total ionizing dose on single event upset sensitivity in static random access memory under proton irradiation
《Chinese Physics B》2014年第11期612-615,共4页肖尧 郭红霞 张凤祁 赵雯 王燕萍 张科营 丁李利 范雪 罗尹虹 王园明 
supported by the Open Foundation of State Key Laboratory of Electronic Thin Films and Integrated Devices,China(Grant No.KFJJ201306)
Synergistic effects of the total ionizing dose (TID) on the single event upset (SEU) sensitivity in static random access memories (SRAMs) were studied by using protons. The total dose was cumulated with high flu...
关键词:single event upset total dose static random access memory imprint effect 
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