ATOMIC-SCALE

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  • 期刊=Nanomanufacturing and Metrologyx
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DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images
《Nanomanufacturing and Metrology》2022年第2期101-111,共11页Hongchu Du 
Financial support from the German Research Foundation(SFB917)is acknowledged;Open Access funding enabled and organized by Projekt DEAL.
Despite the wide availability and usage of Gatan’s DigitalMicrograph software in the electron microscopy community for image recording and analysis, nonlinear least-squares fitting in DigitalMicrograph is less straig...
关键词：Quantitative TEM Nonlinear least-squares fitting Image quantification Image analysis Atomic-scale metrology 
Atomic and Close-to-Atomic Scale Manufacturing:A Review on Atomic Layer Removal Methods Using Atomic Force Microscopy被引量：11
《Nanomanufacturing and Metrology》2020年第3期167-186,共20页Paven Thomas Mathew Brian J.Rodriguez Fengzhou Fang 
the Science Foundation Ireland(SFI)(Nos.15/RP/B32O8&SFI/17/CDA/4637);‘111’project by the State Administration of Foreign Experts Affairs and the Ministry of Education of China(No.B07014).
Manufacturing at the atomic scale is the next generation of the industrial revolution.Atomic and close-to-atomic scalemanufacturing(ACSM)helps to achieve this.Atomic force microscopy(AFM)is a promising method for this...
关键词：Atomic force microscopy Atomic-scale manufacturing Molecular scale devices ELECTROCHEMISTRY ACSM ManufacturingⅢ 
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