Supported by Hong Kong,Macao and Taiwan Science&Technology Cooperation Program of China under Grant No2014DFH10190;the Distinguished Young Scientists Foundation of Jiangsu Province under Grant No BK20130021;the National Natural Science Foundation of China under Grant Nos 61204083 and 61306092;the Qing Lan Project
The dependencies of hot-carrier-induced degradations on the effective channel length Lch,eff are investigated for n-type metal-oxide-semiconductor field effect transistor (MOSFETs). Our experiments find that, with d...
Supported by the National Natural Science Foundation of China under Grant Nos 60736033 and 60506020.
Hot-carrier degradation for 90 nm gate length lightly-doped drain (LDD) NMOSFET with ultra-thin (1.4 nm) gate oxide is investigated under the low gate voltage stress (LGVS) and peak substrate current (Isub max...
Hot-carrier energy-transfer rates in GaAs-AlGaAs single and multiple hetero structures are studied based on a balanceequation approach recently developed,The election temperature is almost a universal function of the ...