γ射线辐照对数字型彩色CMOS图像传感器输出特性的影响  

Effect of Gamma-ray Irradiation on Output Characteristic of Color CMOS Digital Image Sensors

作　　者：孟祥提[1] 康爱国[1] 黄强[1] 

机构地区：[1]清华大学核能与新能源技术研究院,北京100084

出　　处：《原子能科学技术》2004年第z1期231-235,共5页Atomic Energy Science and Technology

基　　金：国家自然科学基金(10075029;10375034);清华大学基础研究基金(JC2002058)资助项目

摘　　要：研究了数字型彩色CMOS图像传感器的γ射线辐照效应。采用不同γ射线注量进行积累辐照和单次辐照。积累辐照后捕获的图像在1.2kGy时变得非常差,而单次辐照后图像在1.8kGy时才变得非常差。积累辐照由于类似加电模式而比单次辐照时性能退化严重。Radiation effect of color CMOS digital image sensors was studied by accumulative radiation and single dose radiation at different γ-ray doses. The quality of the picture captured under natural lighting is very poor only at 1.2 kGy for accumulative radiation, but at 1.8 kGy for single dose radiation, showing that the radiation-induced degradation of the device performance for the sensor with accumulative γ-ray doses is much more severe than those with single dose due to like power-on mode.

关 键 词：半导体 CMOS图像传感器 辐照效应 输出特性 

分 类 号：TN304.24[电子电信—物理电子学]