垂直微结构剖面仪速度控制方法研究  

A Method for Controlling Sinking Velocity of Vertical Microstructure Profiler

作　　者：刘玉红[1] 宋诗军[1] 兰世泉[1] 王延辉[1] 房萍萍[1] 

机构地区：[1]天津大学机构理论与装备设计教育部重点实验室,天津300072

出　　处：《机械科学与技术》2015年第5期752-757,共6页Mechanical Science and Technology for Aerospace Engineering

基　　金：国家自然科学基金项目(51105268);国家863计划项目(2010AA09Z102)资助

摘　　要：依据垂直微结构剖面仪工作原理,探讨了垂直微结构剖面仪测量过程中对于下降速度的要求,确定了其下降速度范围。分析了影响垂直微结构剖面仪下降速度的因素,提出了垂直剖面仪下降速度控制的方法:可通过调节垂直剖面仪下降过程中的水阻力来实现对下降速度的控制。对于下降过程中剖面仪所受的水阻力,采用基于动网格技术的流固耦合数值仿真方法,计算了带有弹性阻尼刷的垂直微结构剖面仪的阻力系数,并通过海试试验验证了计算结果的准确性。Based on operating principles of the vertical microstructure profiler( VMP),requirements for its sinking velocity were discussed and the range of its sinking velocity was determined. After analyzing the factors that affect the sinking velocity,the method for controlling it was presented namely adjusting the hydraulic drag during the profiler's free-falling. Based on dynamic mesh,the fluid-structure coupling was calculated with the ANSYS-CFX codes to solve the hydraulic drag of the VMP with elastic drag whiskers. The calculation accuracy was verified by sea tests.

关 键 词：垂直微结构剖面仪 下降速度 阻力 流固耦合 

分 类 号：P716.21[天文地球—海洋科学]