用不对称液晶盒测定挠曲电系数  

Measurement of Flexoelectric Coefficient with the Non-symmetric Planar Aligned NLC Cell

作　　者：陈贵锋[1] 杨国琛[1] 王永学[1] 李微[1] 

机构地区：[1]河北工业大学物理研究所,天津300130

出　　处：《液晶与显示》2004年第4期278-285,共8页Chinese Journal of Liquid Crystals and Displays

基　　金：河北省自然科学基金资助项目(No.197014)

摘　　要：用解析方法研究了电压作用下的沿面校列不对称向列液晶(NLC)盒。着重考虑了挠曲电效应的影响,导出了指向矢倾角θ满足的微分方程和边界条件,计算和讨论了阈值电压以及指向矢分布对盒中央平面对称性破缺参量Δ。提出了一种在给定阈值电压和盒厚时,可确定上、下基板锚定强度及挠曲电参量e(e=(e1+e3)/k11Δε)的新实验方法。The planar aligned nematic liquid crystal cell with the influence of the flexoelectric effect and different anchoring for the two substrates is investigated by an analytical method. The differential coefficient equation and boundary conditions of the tilt angle θ are deduced. We calculate and discuss the threshold voltage u_(th) and the parameter Δ which reflects the symmetry breaking of the director distribution at the middle layer of the cell. Anchoring strengths (A_1,A_2) of two substrates and the flexoelectric coefficient e(e=(e_1+e_3)/k_(11)Δε) can be worked out by measuring the threshold voltage and thickness of the non-symmetric NLC cell.

关 键 词：液晶盒 弱锚定 挠曲电 阈值电压 对称性破缺 

分 类 号：O753.2[理学—晶体学]