基于双模式LFSR的低功耗BIST结构(英文)  

A Low Power BIST Methodology Based on Two-mode LFSR

作　　者：张哲[1] 胡晨[1] 王学香[1] 时龙兴[1] 

机构地区：[1]东南大学国家专用集成电路系统工程中心,南京210096

出　　处：《电子器件》2004年第4期705-709,718,共6页Chinese Journal of Electron Devices

摘　　要：传统的 BIST结构中 ,由于 LFSR产生大量的测试矢量在测试过程中消耗了大量的功耗。为了减少测试矢量的数目而不影响故障覆盖率 ,我们提出了一种新的基于双模式 LFSR的低功耗 BIST结构。首先介绍了功耗模型和延迟模型的基础知识 ,然后给出了用于生成双模式 LFSR的矩阵 ,并介绍了解矩阵方程式的算法。随后说明了新的 BIST结构和用于矢量分组的模拟退火算法。最后 ,基于 Benchmark电路的实验证明这种结构可以在不降低故障覆盖率的同时减少70A new low-power BIST structure with a creative two-mode LFSR is proposed. Traditional LFSR's power consumption is large because it produces large amounts of vectors. In order to reduce numbers of vector without influencing fault coverage, we propose a new BIST structure with two-mode LFSR. The paper first introduces the basic knowledge of power metric and delay model. Then the matrix computation applied in resolving two-mode LFSR is proposed. The methodology of how to resolving the matrix equation is given. The new BIST structure with two-mode LFSR and the Simulated Annealing Algorithm used in Grouping Detecting Vectors is present afterwards. Finally, the experiment based on benchmark circuits shows that this structure can reduce more than 70% of test power consumption without loss of fault coverage.

关 键 词：线性反馈位移寄存器 内建自测试 低功耗 可测性设计 

分 类 号：TP313[自动化与计算机技术—计算机软件与理论]