两级分布式微机系统测试1000管位晶体管参数的新方法  

A New Method for Measuring Parameters by Using Two-stage Distributive Microcomputer System

作　　者：戴义保[1] 

机构地区：[1]东南大学自控系,南京210018

出　　处：《电气自动化》1994年第3期23-26,共4页Electrical Automation

摘　　要：设计了两级分布式微机系统一次测试1000管位晶体管参数的新型系统。通过计算机的集散控制,可一次性完成1000管位的晶体管质量检验任务,上位机IBMPC/XT 作为管理机,下位机由两台单片机系统组成。测试的晶体管参数可直接在屏幕上显示,系统具有硬件电路结构简单、可靠性高、软件调试灵活等优点。In this paper, a new-type transistor parameter system, which uses two- stage distributive microcomputer system to test one thousand transistors at a time, is described. It can complete 1000 transistors' quality verification al one time by collecting and distributing control of the computer. The higher computer IBMPC/XT is arranged as management machine; the lower computer consists of two SCP systems. All tested transistor parameters can display on the screen. The system possesses the advantages of simple hardware circuit, high reliability and flexible software debugging, etc.

关 键 词：晶体管 参数测试 软件 微机 

分 类 号：TN320.7[电子电信—物理电子学]