印版分辨率的检测  

The Testing of the Resolution of Offset Plates

作　　者：王利婕[1] 朱元泓[1] 张旭亮[1] 张正修[1] 罗陈[1] 

机构地区：[1]深圳职业技术学院印刷传播系,深圳518055

出　　处：《北京印刷学院学报》2005年第2期10-13,共4页Journal of Beijing Institute of Graphic Communication

摘　　要：为了获得印版的分辨率,使用印版质量控制条对被测印版施加曝光系列,检测和分析已曝光印版上的微米线区。通过实验研究,可以将印版的分辨率确定为它能在某一曝光量下同时再现的相同宽度的阳像和阴像线条的微米数;通过改变曝光系列,总是可以在印版上复制出某一曝光量下相同微米数的阳像和阴像线条。To get the plate resolution, this paper brought a series of exposure on the tested plate through the plate control strip, detected and analyzed the micron line-area on the tested plate. By experiments and analysis, the plate resolution can be determined as the micron number of the same width of positive and negative lines under a specific exposure. By changing the exposure series, the positive and negative lines with the same micron number can be exist on the tested plate.

关 键 词：分辨率 控制条 曝光量 微米数 

分 类 号：TS807[轻工技术与工程]