SiC超细粉末中总硅量的测定  

DETERMINATION OF THE TOTAL SILICON IN SiC SUPERFINES

作　　者：刘德广[1] 李健[1] 张维明[1] 吴艳华[1] 史爱娥 

机构地区：[1]黑龙江商学院基础部,哈尔滨石油化工设计院

出　　处：《黑龙江商学院学报》1995年第4期29-34,共6页Journal of Harbin Commercial University(Natural Sciences Edition)

摘　　要：研究了采用ＮａＯＨ＋Ｎａ２Ｏ２混合溶液分液ＳｉＣ超细粉末样品，用硅钼蓝示差分光光度法测定高含量硅的方法。与用无水Ｎａ２ＣＯ３＋ＫＮＯ３做混合熔剂相比，降低了分解温度至７００℃，缩短了分解时间。对硅钼蓝分光光度法测定高含量硅的条件进行了试验，结果表明，本方法操作简便、快速、准确度较高。The SiC superfines is decomposed by the solution of NaOH- Na2O2 and the silicon is determined by siliconmolybdic blue differential spectrophotometry.By Contrast with the mixed fusion agent of anhydrous Na2CO3+KNO3,the decomposition temperature is reduced to 700 ℃,the solving time is shorter.Also,the test is performed for condition of determination of the high silicon content.The result shows the method is easy to operate withruore,fast and accurate.

关 键 词：超细粉末 硅 硅钼蓝 分光光度法 碳化硅 

分 类 号：O613.72[理学—无机化学]