覆盖状态内部分枝的测试向量生成  

State Coverage Enhancement Considering Inside Branches and Test Pattern Generation

作　　者：杨修涛[1,2] 鲁巍[1,2] 李华伟[1] 李晓维[1] 

机构地区：[1]中国科学院计算技术研究所,北京100080 [2]中国科学院研究生院,北京100039

出　　处：《小型微型计算机系统》2006年第4期745-748,共4页Journal of Chinese Computer Systems

基　　金：国家自然科学基金项目(90207002;60242001)资助

摘　　要：提出一种能兼顾状态内部分枝的状态覆盖方法.在状态内部分枝树的终端结点处添加状态转换语句,将原先的单个转换分成多个转换分枝;从而实现对原先的状态转换进行扩展,使得用传统的状态测试方法就能够覆盖到状态内部的分枝.为了准确描述该过程,文中给出了分枝扩展的形式化方法.在此基础上,给出一个测试向量生成算法:遍历状态转换有向图;依状态间转换条件生成测试向量;依遍历顺序收集测试向量.通过对ITC99-benchmark中时序电路的试验表明,本文方法是有效的.This article presented an approach to cover the inside branches of states. To cover the inside branches of a state, the state transfer tokens were inserted in to the code. The original transfer between two states was extended to several ones. So, test based on the modified code could cover the inside branches of a state. A formal deception was presented in this paper to explain this approach. The author also proposed an algorithm to generate test pattern. The traversal of directed state graph can help to collect Patterns that can test the sequential Circuit, The experiment conducted on the benchmark of ITC99 revealed that the method was more effective.

关 键 词：状态覆盖 分枝覆盖 测试向量生成 

分 类 号：TP391.76[自动化与计算机技术—计算机应用技术]