谱分析方法的混合电路BIST  

Mixed-signal circuit BIST based on spectral analysis

作　　者：颜学龙[1] 刘春江[1] 

机构地区：[1]桂林电子工业学院电子工程系CAT研究室,广西桂林541004

出　　处：《电路与系统学报》2006年第2期65-68,共4页Journal of Circuits and Systems

基　　金：广西基金资助项目(9811012);(0542050)

摘　　要：SoC芯片内对于混合信号电路测试有着举足轻重的作用。本文介绍了一种通过谱密度分析方法的混合电路内建自测试。此方法通过使用噪声源与比较器数字量化得到被测信号的频谱特性。它的主要特点是电路简单、抗干扰性能强和多点插入多路并行采集,不需要多位AD转换器和多路选择开关。此方法基本上是全数字式的,采用一位量化,数据处理速度快,能满足给定条件下的实时处理要求;并可利用系统内已有的资源,适应于SoC环境。本文给出了系统实现的详细结构和一个测试锁相环电路的测试仿真实例,验证了谱分析方法的测试有效性。Testing the mixed-signal circuit is very important in the SoC. This paper presents a built-in self-test method for mixed-signal circuits based on PSD analysis is presented. A noise signal generator and some analog comparators are used to capture analog signal spectral information. Its main advantages are simplicity, low analog area overhead and suitability to multi-channel acquisition, without the need of multi-bit AD converter and analog switches. The method is almost completely digital and one-bit quantified data process which meets the need of real-time processing under the limited conditions, and is suitable to the SoC environment. The system framework and an emulation, in which the validity of the spectral analysis method is verified are presented.

关 键 词：内建自测试 片上系统 功率谱密度 数模混合电路 

分 类 号：TN45[电子电信—微电子学与固体电子学]