一种微处理器芯片的验证测试分析及应用  

Verification Test Analysis and Application for a Microprocessor Chip

作　　者：檀彦卓[1] 韩银和[1] 李晓维[1] 

机构地区：[1]中国科学院计算技术研究所

出　　处：《计算机工程》2006年第9期219-221,共3页Computer Engineering

基　　金：国家自然科学基金资助项目(90207002;60242001);北京市科技重点基金资助项目(H020120120130)

摘　　要：验证测试技术是验证芯片设计正确与否的重要环节,不仅向设计者及时反馈了有效的信息以尽早发现错误、改进设计,并能为降低测试成本和生产测试提供有效保障。基于实际工程,该文提出了一个较有效的验证分析流程方案,采用多测试项目融合的测试法对一款微处理器芯片进行了验证分析,并对相关测试项目进行了定量、定性的评估。The verification test technique plays a key role in checking the correctness of the IC design. It can not only return the effective data in time to finding the errors and improve the design as soon as possible, but also provide a cost-effective way to reduce the test cost and ease the later manufacture test. Based on an actual engineering project, this paper proposes a better verification test flow. By integrating multiple test methods into this flow, this paper verifies a type of microprocessor chip and gives the quantitative and qualitative analysis for the related test projects.

关 键 词：验证测试 生产测试 失效分析 可测试性设计 故障模型 

分 类 号：TP391.72[自动化与计算机技术—计算机应用技术]